How Best to Fail Webinar
Power Interruption Testing: How Best to Fail
This webinar explores the failure points of file systems and flash media; from dropped batteries to system failures, embedded designs need solid power interruption testing. Reliability demands for embedded products have increased as the desired lifetime of high reliability products has grown.
To achieve the most comprehensive reliability test in the least time, stress testing must utilize I/O at the point of power interruption. Join us for this reprise of our popular session presented at Embedded World 2018 to learn how to make your reliability testing as effective as possible.