Automotive

Security and Cars dominate Embedded World 2018

Datalight spoke at the 16th Embedded World Conference. For more news about the show, read our blog recap.

Another failed update: Connected cars, over-the-air updates, and what happens when it goes wrong

Recently a failed update once again emphasized the importance of testing all aspects of product updates before going live with them. This can be the best strategy to avoid angry users who quickly take to social media to express their frustrations.

Datalight & NXP – New Automotive Technology at FTF Connects

Earlier this month, Datalight attended the NXP FTF Connects conference in Detroit, focusing on the automotive industry. The conference showcased NXP’s latest innovation and technology with an emphasis on the automotive market.

NXP FTF Connects – Autonomous Vehicles & Fail-Safe Data

Last week, Datalight participated in the “NXP FTF Connects” conference in Detroit. The conference showcased NXP’s latest innovation and technology with an emphasis on the automotive market. As a partner of NXP, Datalight was given the opportunity to demonstrate our highly reliable file systems and flash management at the NXP Tech Lab. We shared a well-received demo that compares the power failsafe characteristics of Reliance Edge with data corruption experience with FAT file systems.

How Do You Troubleshoot Data Corruption?

In the world of embedded computing, data-related failures are unfortunately part of being in business. Even with the right hardware, software and development, frustrating and costly failures can occur. But when issues do surface, many companies don’t possess the right tools to troubleshoot the challenges they run into.

CES 2016 – Hot Topics You May Have Missed

CES showcases amazing innovations, and this year the hot topics were wearable technology, automotive technology, smart home, and drones. As devices gain greater functionality and have to handle more data, the need for power failsafe file systems like Reliance Edge become more important.

Root Cause Analysis: The Quest for Zero Defects

Today automotive OEMs—and by extension, their suppliers—are being held to a standard that demands absolute answers whenever a component or system fails. The safeguards built in and care taken in developing these systems is high and failures are a rare occurrence, only small fractions of a percentage.

CES 2015

In January I attended the International CES with 170,000 of my closest friends, about 25% of whom were from outside of the US. Together we attempted to visit 3500 exhibitors and listen to many, many keynotes, panels and speeches.

Write Amplification: The Next Device Optimization Battle?

Wikipedia describes Write Amplification as "an undesirable phenomenon associated with Flash memory and solid-state drives (SSDs) where the actual amount of physical information written is a multiple of logical amount intended to be written," and offers this formula to calculate it: